Optical metrology is both a means and an end to solving many an optical problem.

As the old saying goes, "if you can't measure it, you can't make it."

The images above are examples of large and very small things I have measured over my career.

The top image shows white light fringes of a photolithographically-produced grating on a silicon wafer. The trenches are several fringes deep making this a very challenging problem. At Wyko we developed multiple-wavelength interferometric microscopy to measure these gratings based upon the research I did for my PhD dissertation.

The bottom image is of a LIGO (laser interferometer gravity-wave observatory) ITM (input test mass). These very high precision surfaces required specialized manufacturing and testing procedures that I helped CalTech develop when I acted as the optics consultant for the core optics over almost a decade and a half.

With my more than 38 years experience in optics and optical metrology, I can help you solve your testing problems and help you implement new technologies.